Code: 11FYPO1 Surface Physics 1
Lecturer: doc. Ing. Ladislav Kalvoda CSc. Weekly load: 2+0 Completion: EX
Department: 14111 Credits: 2 Semester: W
Description:
1. Historical remarks. Geometrical and thermodynamic approach to a surface (fractal surfaces, Gibbs model of ideal surface, surface tension and specific surface free energy, surface relaxation and surface reconstruction). 2. Vacuum and clean surface preparation techniques: Surface contamination, UHV systems, vacuum pumps, vacuum gauges, special techniques of clean surface preparation. 3. Surface chemical composition. Surface sensitivity of traditional "bulk" methods. Spectroscopy of secondary electrons (SE). Characteristic features of SE energetic spectrum. 4. Electron energy analyzers. Principles of Auger electron spectroscopy (AES) and photoelectron spectroscopy (XPS). 5. Quantitative analysis of surface chemical composition. Construction of SE spectrometers. 6. Mass spectroscopy of secondary particles. SIMS: Basic theoretical aspects, quantitative analysis, assets and drawbacks. Further methods utilizing secondary particles. Construction of spectrometers and ionic sources. 7. Analysis of a depth chemical composition profile: non-destructive method based on variation of the signal registration depth, method of skew cut, surface sputtering. 8. Application of SAXS methods to chemical composition analysis. Microscopic techniques of surface composition analysis (SAEM, SMS, POSAP). 9. Surface structure. Description of 2D-periodic crystalline struktury: Direct and reciprocal lattice. Diffraction on 2D structures: Laue conditions and Ewald construction. Orientation of surface. 10. Surface sensitivity of classical methods of structure analysis. Low energy electron diffraction (LEED), reflection high energy electron diffraction (RHEED). 11. Surface-oriented X-ray diffraction techniques. Field emission electron and ion microscopy. Evanescent EM field techniques. 12. Scanning probe microscopy methods. 13. Surface extended X-ray absorption fine structure (SEXAFS). Simple theoretical prediction of surface structures: Chadi model.
Contents:
1. Historical remarks. Geometrical and thermodynamic approach to a surface (fractal surfaces, Gibbs model of ideal surface, surface tension and specific surface free energy, surface relaxation and surface reconstruction). 2. Vacuum and clean surface preparation techniques: Surface contamination, UHV systems, vacuum pumps, vacuum gauges, special techniques of clean surface preparation. 3. Surface chemical composition. Surface sensitivity of traditional "bulk" methods. Spectroscopy of secondary electrons (SE). Characteristic features of SE energetic spectrum. 4. Electron energy analyzers. Principles of Auger electron spectroscopy (AES) and photoelectron spectroscopy (XPS). 5. Quantitative analysis of surface chemical composition. Construction of SE spectrometers. 6. Mass spectroscopy of secondary particles. SIMS: Basic theoretical aspects, quantitative analysis, assets and drawbacks. Further methods utilizing secondary particles. Construction of spectrometers and ionic sources. 7. Analysis of a depth chemical composition profile: non-destructive method based on variation of the signal registration depth, method of skew cut, surface sputtering. 8. Application of SAXS methods to chemical composition analysis. Microscopic techniques of surface composition analysis (SAEM, SMS, POSAP). 9. Surface structure. Description of 2D-periodic crystalline struktury: Direct and reciprocal lattice. Diffraction on 2D structures: Laue conditions and Ewald construction. Orientation of surface. 10. Surface sensitivity of classical methods of structure analysis. Low energy electron diffraction (LEED), reflection high energy electron diffraction (RHEED). 11. Surface-oriented X-ray diffraction techniques. Field emission electron and ion microscopy. Evanescent EM field techniques. 12. Scanning probe microscopy methods. 13. Surface extended X-ray absorption fine structure (SEXAFS). Simple theoretical prediction of surface structures: Chadi model.
Seminar contents:
N/A
Recommended literature:
Key references: ^^[1]. M. Prutton, Introduction to Surface Physics, Clarendon Press, Oxford 1998. ^^Recommended references: ^^[2]. D.P. Woodruff, T.A. Delchar, Modern Techniques of Surface Science (2nded.) Cambridge University Press, Cambridge 1994.
Keywords:
Surface; thin layer; chemical composition of; crystalline structure of; theoretical description of; experimental analysis of.

Abbreviations used:

Semester:

Mode of completion of the course:

Weekly load (hours per week):